Program Committee

Lee R. Allen, Allen Applied Infrared Technology, Emeritus Member; Nicolas P. Avdelidis, EBETAM S.A. (Greece); Pierre Bremond, Cedip Infrared Systems (France); Antonio Colantonio, Public Works and Government Services Canada (Canada); Fred P. Colbert, Colbert Infrared Services; K. Elliott Cramer, NASA Langley Research Ctr.; Ralph B. Dinwiddie, Oak Ridge National Lab.; Ermanno G. Grinzato, Consiglio Nazionale delle Ricerche (Italy); Sheng-Jen Hsieh, Texas Agricultural & Mechanical Univ.; Herbert Kaplan, Honeyhill Technical Co.; Timo T. Kauppinen, VTT (Finland); Dennis H. LeMieux, Siemens Corporate Research; Sven-Åke Ljungberg, Univ. of Gävle, Emeritus Member (Sweden); Robert P. Madding, FLIR Systems, Inc.; Xavier P. V. Maldague, Univ. Laval (Canada); G. Raymond Peacock, Temperatures.com, Inc.; Piotr Pregowski, Pregowski Infrared Services (Poland); Austin A. Richards, FLIR Systems; Andrés E. Rozlosnik, SI Termografía Infrarroja (Argentina); Morteza Safai, The Boeing Co.; Takahide Sakagami, Osaka Univ. (Japan); R. James Seffrin, Infraspection Institute; Steven M. Shepard, Thermal Wave Imaging, Inc.; John R. Snell, Jr., Snell Infrared; Gregory R. Stockton, Stockton Infrared Thermographic Services, Inc.; Lisa West Åkerblom, FLIR Systems AB (Sweden)
Monday 17 March

Vendor Presentations and Reception IV

Date: Monday 17 March

Time: 5:00 PM - 8:00 PM

Session Chairs: Andrés E. Rozlosnik, SI Termografía Infrarroja (Argentina); G. Raymond Peacock, Temperatures.com, Inc.

For the forth year, in conjunction with the Thermosense XXX conference, hardware and software vendors will give a brief presentation on what is new this year in their product lines that impact thermal imaging practices and applications. All presenting companies have a booth in the exhibition hall.

The intent of this workshop is to bring together Vendors and Early Arrival Thermosense and DSS exhibitors to highlight the newest products and services being shown at the Exhibition. In this way the busy technical conference attendees can better prioritize their activities when visiting the exhibits. It is also a relaxed opportunity for getting to know one another better and to have informal discussions on matters of mutual interest. A limited time for 10 to 15 minute vendor presentations starts the session, followed by a reception with snacks and soft drinks.


AVIO-Nippon Avionics Co., Ltd. (Booth 1417)

New IR Thermography Products from Nippon Avionics

Presenter: Yukinori Kimura, Manager, Partner Business Dept.


Cantronic Systems, Inc. (Booth 518)

Thermal Surveillance Relationship Between Target Distance and Pixels

Presenter: Jon Chynoweth, Executive Vice President


Cedip Infrared Systems (Booth 1317)

High-spatial Resolution Thermal Imaging Cameras and Portable Cameras for R&D Applications

Presenter: Pierre Bremond, Export Sales Manager, Industrial Applications and Thermography


Electrophysics Corp. (Booth 413)

640 X 480 Thermography Camera with Dual Laser Sighting

Presenter: Art Stout, Vice President, Business Development


FLIR Systems, Inc.-Commercial Vision Systems (Booth 603)

FLIR's Commercial Uncooled Cores: Automotive, Fire Fighting, and Military Applications

Presenter: Jay James, Vice President of Business Development for Cores and Components


Infrared Cameras Inc. (Texas Infrared) (Booth 1105)

ICI Prodigy and ICI Mirage: Medical, Aerospace, and Petrochemical Applications

Presenter: Gary Strahan, President


IRCAM GmbH (Booth 17)

New IR Cameras, Systems, and Software for IR Imaging and Thermography

Presenter: Monica Lopez Saenz, Managing Director and Co-Founder


Jenoptik-IR (Booth 1427)

Infrared Relay Lens for High-magnetic Environment Applications

Presenter: Ray Watts, Sales Manager


NEC Corp. (Booth 1417)

New Infrared Detector Module from NEC

Presenter: Hiroaki Ono, Assistant Manager


NEC San-ei Instruments, Ltd. (booth 1417)

Sensor Fusion Solution with TS9230/TS9260-New Fixed-mount Thermal Imaging Network Camera with Ruggedness and Reliability

Presenter: Tetsuo Tamura, Senior General Manager, Infrared Systems Dept.


Santa Barbara Infrared, Inc. (Booth 503)

Automated Testing of IR/EO Sensor Systems

Presenter: Alan Irwin, Senior Systems Engineer


SCD-SemiConductor Devices (Booth 903)

BIRD640 and SCD's Road Map for Uncooled Products

Presenter: Fabian Schapiro, Marketing Manager


Sensors Unlimited, Inc., (part of Goodrich Corp.) (Booth 717)

Extending InGaAs Wavelength Response: Advancements in InGaAs Technology and Applications

Presenter: Marc Hansen, Applications Engineer


StingRay Optics, LLC (Booth 1311)

Optics for NIR/SWIR Imaging

Presenter: Jennifer Myers, Sales and Marketing Manager


Surface Optics Corp. (Booth 907)

Field Emissivity Measurements Increase Accuracy of Temperature Predictions

Presenter: Brian Catanzaro, Consultant


Thermoteknix Systems Ltd. (Booth 1111)

Continued Advances in Miricle Increase Thermal Imaging Cameras from Thermoteknix

Presenter: Alistar Brown, Product Manager, Imaging

Tuesday 18 March

Session 1: Pyrometry, Temperature Measurements, and Calibration I

Date: Tuesday 18 March

Time: 8:00 AM - 9:00 AM

Session Chairs: G. Raymond Peacock, Temperatures.com, Inc.; Robert P. Madding, FLIR Systems, Inc.

Infrared micro-thermography of an actively heated preconcentrator device

Paper 6939-1

Time: 8:00 AM - 8:20 AMAuthor(s): Robert Furstenberg, Christopher A. Kendziora, Stanley V. Stepnowski, Robert A. McGill, Naval Research Lab.

High-temperature IR-imager with wide dynamic range for industrial process control

Paper 6939-2

Time: 8:20 AM - 8:40 AM
Author(s): Uwe Hoffmann, Günter Hofmann, Dimitar Wassilew, Norbert Hess, Manfred Zimmerhackl, DIAS Infrared GmbH (Germany)

Emissivity independent low-temperature pyrometry

Paper 6939-3

Time: 8:40 AM - 9:00 AM
Author(s): Ivan Dolezal, Lubos Hes, Technical Univ. of Liberec (Czech Republic)

Symposium-Wide Plenary Presentation

Date: Tuesday 18 March

Time: 9:15 AM - 10:00 AM

The Honorable Jay Cohen, Under Secretary for Science and Technology, U.S. Dept. of Homeland Security

Coffee Break10:00 AM - 10:30 AM

Session 2: Pyrometry, Temperature Measurements, and Calibration II

Date: Tuesday 18 March

Time: 10:30 AM - 11:50 AM

Session Chairs: G. Raymond Peacock, Temperatures.com, Inc.; Robert P. Madding, FLIR Systems, Inc.

Spectrally resolved calibration of flat-plate blackbody sources and targets in thermal IR

Paper 6939-4

Time: 10:30 AM - 10:50 AM
Author(s): Sergey N. Mekhontsev, Vladimir B. Khromchenko, Leonard M. Hanssen, National Institute of Standards and Technology

Infrared calibration development at Fluke Corporation Hart Scientific Division

Paper 6939-5
Time: 10:50 AM - 11:10 AM
Author(s): Frank Liebmann, Fluke Corp.

AIRI mid-IR reference pyrometer for near-ambient radiation thermometry

Paper 6939-6

Time: 11:10 AM - 11:30 AM
Author(s): Vladimir B. Khromchenko, Space Dynamics Lab.and National Institute of Standards and Technology; Sergey N. Mekhontsev, Leonard M. Hanssen, National Institute of Standards and Technology

IEC 62942-1 TS: first international technical specification on the technical data for radiation thermometers

Paper 6939-53

Time: 11:30 AM - 11:50 AM
Author(s): Joerg Hollandt, Physikalisch-Technische Bundesanstalt (Germany); O. Struss, HEITRONICS Infrarot Messtechnik GmbH (Germany); Geoff Beynon, Land Instruments; Rien Bosma, NMi-Van Swinden Lab. B.V. (Netherlands); R. Gaertner, Raytek GmbH (Germany); F. Girard, Istituto Nazionale di Ricerca Metrologica (Italy); M. S. Matveyev, D.I. Mendeleyev Institute for Metrology (Russia); Helen C. McEvoy, National Physical Lab. (United Kingdom); G. Raymond Peacock, Temperatures.com, Inc.; M. Sadli, Lab. National de Metrologie et d'Essais (France); Fumihiro Sakuma, National Institute of Advanced Industrial Science and Technology (Japan); Howard W. Yoon, National Institute of Standards and Technology; Z. Yuan, National Institute of Metrology (China)

Session 3: Professional Standards I

Date: Tuesday 18 March

Time: 11:50 AM - 12:30 PM

Session Chairs: Lisa West Åkerblom, FLIR Systems AB (Sweden); Antonio Colantonio, Public Works and Government Services Canada (Canada)

Do thermographers need a professional association?

Paper 6939-7

Time: 11:50 AM - 12:10 PM
Author(s): G. Raymond Peacock, Temperatures.com, Inc.

ASNT-based certification for thermographers

Paper 6939-8

Time: 12:10 PM - 12:30 PM
Author(s): John R. Snell, Jr., Snell Infrared

Session 4: Professional Standards II

Date: Tuesday 18 March

Time: 1:30 PM - 2:50 PM
Session Chairs: Lisa West Åkerblom, FLIR Systems AB (Sweden); Antonio Colantonio, Public Works and Government Services Canada (Canada)

International standards: thermography, training, and certification

Paper 6939-9

Time: 1:30 PM - 1:50 PM
Author(s): Lisa West Åkerblom, FLIR Systems AB (Sweden)

International standards related to infrared thermography applications for buildings and infrastructure: defined gaps and potential work

Paper 6939-10

Time: 1:50 PM - 2:10 PMAuthor(s): Antonio Colantonio, Public Works and Government Services Canada (Canada)

The usefulness of existing standard of qualitative building thermography

Paper 6939-11

Time: 2:10 PM - 2:30 PMAuthor(s): Timo T. Kauppinen, VTT (Finland)

The professional thermographer and certification, standards, and liability

Paper 6939-12
Author(s): Fred P. Colbert, Colbert Infrared Services.

Session 5: Thermal Image Fusion

Date: Tuesday 18 March

Time: 2:50 PM - 3:30 PM

Session Chair: Herbert Kaplan, Honeyhill Technical Co.

Image fusion: multifocus function and its application

Paper 6939-13

Time: 2:50 PM - 3:10 PM
Author(s): Yukinori Kimura, Ichikawa Akihiko, Nippon Avionics Co., Ltd. (Japan)

IR and ultraviolet image fusion

Paper 6939-14

Time: 3:10 PM - 3:30 PM
Author(s): Fred P. Colbert, Colbert Infrared Services

Session 6: IR Neighbors: NIR, Visible, and UV I

Date: Tuesday 18 March

Time: 4:00 PM - 5:00 PM

Session Chairs: Herbert Kaplan, Honeyhill Technical Co.; Jan K. Eklund, EKLUND INFRARED, Inc.

Industrial defect discrimination applying infrared imaging spectroscopy and artificial neural networks

Paper 6939-15

Time: 4:00 PM - 4:20 PM
Author(s): Pilar Beatriz Garcia-Allende, Olga M. Conde, Francisco J. Madruga, Ana M. Cubillas, Jose M. Lopez-Higuera, Univ. de Cantabria (Spain)

Overview of SWIR detectors, cameras, and applications 

Paper 6939-16
Time: 4:20 PM - 4:40 PM
Author(s): Douglas S. Malchow, Marc Hansen, SUI, Goodrich Corp.

Calibration of visible and near-infrared spectrums for measuring freshness of vegetables 

Paper 6939-17

Time: 4:40 PM - 5:00 PM
Author(s): Faisal Abdullah, Chow Jeng Wong, Mohd Zubir Mat Jafri, Mohamad Suhaimi Jaafar, Univ. Sains Malaysia (Malaysia)

Session 7: IR Neighbors: NIR, Visible and UV II

Date: Wednesday 19 March

Time: 8:00 AM - 8:40 AM

Session Chairs: Herbert Kaplan, Honeyhill Technical Co.; Jan K. Eklund, EKLUND INFRARED, Inc.

High-voltage electrical survey advances using UV/IR>

Paper 6939-18
Time: 8:00 AM - 8:20 AMAuthor(s): Dan Ninedorf, Ox Creek Energy Associates, Inc.

Overview of expanding the longwave NDT into the shortwave spectrum below visible

Paper 6939-19
8:20 AM - 8:40 AM