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New electro-optic architecture outperforms opto-mechanics

SPIE Industrial Sensing - Fri, 2008-03-07 10:12
When liquid crystals are combined with optical waveguides, unprecedented voltage control over light becomes possible, enabling new types of light-controlling devices.

Banknote verification using 3D profilometry techniques

SPIE Industrial Sensing - Fri, 2008-03-07 10:12
New sensor systems are being developed to scan banknote security features such as holographic patterns, ink fluorescence, watermarks, microprinting, and intaglio patterns.

Intrinsic polymer optical fibers for large deformation strain sensors

SPIE Industrial Sensing - Fri, 2008-03-07 10:12
Single-mode fibers demonstrate coherent lightwave propagation and show promise as interferometry-based sensors for large-scale strain applications.

A lifetime in optics: A video interview with Robert Edmund

SPIE Industrial Sensing - Fri, 2008-03-07 10:12
As the CEO of Edmund Optics, Robert Edmund has a unique perspective on the industry. He talks about growing up in optics, how the company has changed, globalization, and his outlook for the industry.

Optically transduced MEMS/NEMS resonators: A video interview with Harold Craighead

SPIE Industrial Sensing - Fri, 2008-03-07 10:12
Optical approaches provide robust and relatively non-invasive methods for excitation and detection of the motion of micro- and nanomechanical structures.

TEMPBEIJING 2008 ABSTRACTS DUE 3/31/2008

TempSensorNEWS - Fri, 2008-03-07 03:05
TEMPBEIJING 2008: Oct 20-23, 2008, Beijing, China. Beijing, P.R.China -- TEMPBEIJING 2008, will will be held on October 20-23, 2008 in Beijing, China. Abstracts in English, the official Conference language, are due by March 31, 2008 It has been more than ten years since the previous symposium on temperature measurements, which was organized by the Chinese Society for Measurement (CSM), was held in Beijing in 1997. TEMPBEIJING 2008 will offer an opportunity for scientists and engineers to present new advances in temperature and thermal measurements, either theoretical, experimental or applied. It is also a platform for them to exchange ideas on existing problems, future needs and prospects, and discuss about the controlling technology. The Conference will gather specialists worldwide, actively engaged in research and application in the discipline of temperature and thermal measurements and related science and technology.

Thermography TRAINING & NIR and SWIR Imaging Applications

TempSensorNEWS - Thu, 2008-03-06 03:05
IR Basics Short Courses at SPIE’s DSS in Orlando These are the two Short Courses offered by the ThermoSense Steering Committee and also recommended to those planning to attend the Homeland Security or IR Systems Conferences. 1. SC836: Using IR Thermographic Instruments - A Primer for Thermographers 17 March 2008, 1:30PM-5:30 PM Course Level: Introductory CEU: 0.35 2. SC710: NIR and SWIR Imaging Applications 18 March 2008, 8:30AM-12:30 PM Course Level: Introductory CEU: 0.35

Tiger Optics HALO+ at PITTCON

TempSensorNEWS - Wed, 2008-03-05 03:05
Award-winning Addition to the HALO Family of Analyzers Providing Fast, Accurate and Affordable Trace Moisture Analysis New Orleans LA USA – Tiger Optics LLC has announced at PITTCON 2008 the exhibition of the HALO+™ trace moisture analyzer, newly-announced winner of the 2008 Golden Gas Award for Gas Analysis/ Gas Chromatography. The HALO+, a mini-Continuous Wave Cavity Ring-Down Spectroscopy (CW-CRDS) analyzer capable of measuring at the parts-per-trillion (PPT) levels, covers a wider dynamic range than any other trace gas analyzer on the market. It offers unmatched accuracy, speed, repeatability and low cost-of-ownership for which Tiger Optics analyzers are known worldwide. The latest addition to the HALO family of analyzers, the HALO+ is a sibling to Tiger Optics’ popular HALO, first unveiled one year ago at PITTCON 2007.

Emittance of infrared windows

SpectralEmissivity - Wed, 2008-03-05 01:33
Emittance measurements on infrared windows exhibiting wavelength dependent diffuse transmittance S. E. Hatch Applied Optics, Vol. 1, Issue 5, pp. 595-601 Citation S. E. Hatch, “Emittance measurements on infrared windows exhibiting wavelength dependent diffuse transmittance,” Appl. Opt. 1, 595-601 (1962)

Webcast: on Ultra-Accurate Temperature Measurement

TempSensorNEWS - Tue, 2008-03-04 09:17
Robust Enough For Any Environment REGISTER FOR DT's TEMPpoint WEBCAST on March 13, 2008 Marlborough MA, USA -- Do you have a temperature measurement application? Learn how advanced technology in analog design will benefit your temperature measurement application to achieve the results you require. No matter what the environment, automotive, energy, biotech, manufacturing, aerospace, R&D, etc., TEMPpoint offers a 48 channel stand-alone instrument with ready-to-measure application software for measuring data - acquire, display, log data without writing any code. See everything you need to know to make ultra-accurate temperature measurements.

High Temperature Dewpoint

TempSensorNEWS - Mon, 2008-03-03 03:05
See them at PITCONN 2008 this week The new Vaisala DRYCAP® Dewpoint transmitters DMT345 & 346 are capable of measuring dewpoint in-situ at process temperatures up to 660°F. These unique instruments are proven in a variety of difficult applications, including glassmaking, fluid bed dryers, and industrial ovens.

Freeze dryers, sample concentrators & evaporators for all budgets & applications

TempSensorNEWS - Sun, 2008-03-02 03:05
Ipswich, UK & Valley Cottage NY, USA -- Genevac has chosen Analytica 2008 to exhibit its latest innovative products for centrifugal evaporation, sample concentration and freeze drying. Visitors to Hall B2, Stand 544 will be able to see the latest fast and efficient freeze dryers - the Virtis Advantage Plus and the Benchtop K series. Featuring the latest advancements in benchtop freeze drying, the Virtis AdVantage Plus is available with up to three fluid cooled shelves which maintain temperature control precision previously available only in pilot / production scale units. Each compact unit is loaded with functions that enable materials to be processed quickly, efficiently, and conveniently.

PXI Precision RTD Simulator

TempSensorNEWS - Sat, 2008-03-01 03:05
NEW Product from Pickering Interfaces Clacton on Sea, UK –Pickering Interfaces is expanding its range of PXI products with the introduction of the high accuracy Resistance Temperature Detector (RTD) simulator. The 40-262 is an 18 channel variable resistor module designed to simulate the operation of PT100 and PT1000 RTD’s with unprecedented resolution and accuracy in the PXI form factor. The 40-262 provides a resistance setting resolution of better than 10 mΩ over the entire resistance range and an accuracy of better than 0.1% for all resistance settings, allowing RTDs to be simulated with great accuracy. The 40-262 uses an innovative (patented) design principal that combines fine and coarse control mechanisms in combination with a calibration system to achieve its excellent performance.

Spectral emittance of refractory materials

SpectralEmissivity - Sat, 2008-03-01 01:29
Spectral emittance of refractory materials Henry H. Blau, Jr. and John R. Jasperse Applied Optics, Vol. 3, Issue 2, pp. 281-(1964) Citation H. H. Blau, Jr. and J. R. Jasperse, “Spectral emittance of refractory materials,” Appl. Opt. 3, 281- (1964)
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